Background introduction
During the manufacture of electronic products, the quality problems of the products caused by unreasonable design, raw materials or process measures can be summarized into two categories. The first category is that the product performance parameters are not up to standard, and the second category is potential defects. Aging means that the DUT is overloaded so that defects can occur within a short period of time to avoid failure during early use. The aging test usually needs to apply accelerated environmental stress. Among the commonly used environmental stresses, the aging effect with temperature changes is best. The system provides an aging environment by controlling the temperature, simulates the use environment, and checks whether the function of the components is normal.
product description
The electronic component aging test system can realize the inspection of various electronic components into the factory. The system uses advanced modular instruments and hardware. It also adopts the self-developed signal routing matrix, fixtures, and general software test platform.
The system functions mainly include automatic testing of various functions and electrical indicators of electronic components at room temperature to 180°C ambient temperature, and performance evaluation and screening of the tested parts.
The system can test a variety of different types of components, including resistors, capacitors, inductors, voltage regulators, diodes, transformers, etc. Up to now, it has reached more than 200 kinds, and it is easy to expand.
Technical highlights
â— Online environment simulation and real-time testing
One of the major technical highlights of the system is dynamic aging, ie, setting the aging temperature point, aging time, and cycle test interval at room temperature to 180°C, and testing the performance of components in real time at various temperature points.
Compared to static aging, the benefits of dynamic aging include: 1. Moving time-consuming functional tests to aging can save expensive high-speed test equipment. 2. The actual aging time to achieve the expected failure rate is relatively shorter and saves costs. 3, the real-time record generated has more analysis value.
System characteristics
· High reliability and scalability
The system realizes automatic test process control and is simple in operation. Except that the loading and unloading parts are manually completed, other testing processes are automatically completed by the system. The software and hardware fully consider the exception handling mechanism and can continuously run without failure for a long time.
The system supports the generation and measurement of multiple signals and multiple parameters. The system uses data acquisition cards, digital multimeters, waveform generators, digital oscilloscopes and Agilent's LCR meters, and supports more independent instruments and traditional equipment. , to ensure the applicability of the hardware, with a wide range of hardware infrastructure for future maintenance and expansion.
Intelligent routing and modular fixtures
The system integrates large-scale signal routing matrices developed by Pan-China. The number of resource channels can reach 192 (×8)×16, and it is compatible with transmission of high-frequency signals of 10 MHz bandwidth and 3A power signals. The insulation between the channels is greater than 1GΩ, the line impedance is less than 600MΩ, and crosstalk 1MHz is less than -60dB. Aging board adapter fixture temperature up to 270 °C.
The component interface can be customized based on the DUT. The instrument interface adopts a modular standard design to ensure that it can be replaced and disassembled, and it can adapt to numerous instruments, ensuring that the system has a great expansion of compatibility and application scope.
· Efficient process testing and control
Based on the test management process software of the Pan-China Test On Demand, it facilitates the editing and operation of parallel sequences, and enables accurate functional testing of numerous electronic devices, including resistors, capacitors, inductors, voltage regulators, diodes, and transformers. The test covers resistance, capacitance, inductance, ripple suppression ratio, and pressure resistance.
· Flexible test results display
With powerful data storage, analysis and report generation functions, it can classify and save test curves of different components on the same aging board at different temperature points for easy viewing and data backtracking.
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